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HIOKI ZC2003 6-Slot Switch Mainframe Scanning Module Rack for ZC2004 Multiplexer 528-Channel Lithium Cell Batch Testing

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HIOKI ZC2003 6-Slot Switch Mainframe Scanning Module Rack for ZC2004 Multiplexer 528-Channel Lithium Cell Batch Testing

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Model Number : Scanning module rack ZC2003

Protectionrating : IP65, IP67

Payment Terms : T/T

Material : Stainless Steel, Brass

Supply Ability : 99pcs/4-6weeks

Outputinterface : RS485, HART, Modbus

MOQ : 1

Delivery Time : 4-6weeks

Operatingtemperature : -40°C to 85°C

Switch Type : Semiconductor non-relay switch

Price : 1900-2700USD

Outputsignal : 4-20 mA, 0-10 V, Digital

Module Slots : 6 slots for ZC2004 multiplexer

Switch Speed : 1.3ms per channel

Communication Ports : LAN, USB, EXT.CONTROL, CONTROL

Certification : CO

Powersupply : 12-24 V DC

Max Input Voltage : DC 60V, AC 30V rms

Place of Origin : Japan

Mountingoptions : Panel mount, Surface mount, DIN rail

Max Channels : 528 4-wire channels (2 racks cascaded)

Brand Name : HIOKI

Measurementrange : 0 to 1000 psi

Compatible Testers : BT3561A / BT3562A / BT3563A / BT3564

Packaging Details : Export standard carton with shockproof inner foam

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Overview

HIOKI ZC2003 is a compact scanning module mainframe dedicated for lithium multi-cell batch impedance & OCV testing. It has 6 built-in slots to install ZC2004 multiplexer modules, supporting max 268 4-wire channels per single rack, two racks cascaded to reach 528 channels.

Adopts maintenance-free semiconductor switches with only 1.3ms fast switching speed, circuit design reduces cross-channel measurement error. Built-in independent fuse for every channel prevents short-circuit damage, adjacent channel compensation eliminates metal conductor interference to guarantee precise readings. Supports simultaneous connection of two BT-series battery testers, single LAN port controls dual racks via ZC9000 link cable, saving industrial PC communication ports. Widely deployed in lithium cell sorting, EV power battery and energy storage module production lines.

Core Features
  1. 6 module slots, compatible with ZC2004 scanning multiplexer
  2. Max 264 4-wire channels per rack, cascade 2 racks up to 528 channels
  3. Semiconductor switch, 1.3ms ultra-fast channel switching, zero mechanical wear
  4. Adjacent channel compensation function, suppress metal eddy current measurement drift
  5. Independent short-circuit fuse protection for every single test channel
  6. Dual tester linkage, one rack connects two BT356xA battery testers at once
  7. Single-port cascade control via ZC9000 cable, less PC communication ports occupied
  8. Compact half-width cabinet design, save production line installation space
  9. Standard LAN/USB/RS232 interfaces, seamless match CN040 scanning test software
Item Standard Parameter
Model ZC2003 Scanning Module Rack (Switch Mainframe)
Brand HIOKI Made in Japan
Module Slots 6 slots for ZC2004 multiplexer
Max Channels (Single Rack) 2-Wire: 528ch; 4-Wire: 264ch
Max Channels (2 Racks Cascaded) 4-Wire: 528ch
Switch Type Semiconductor non-relay switch
Switch Speed 1.3ms per channel
Safety Design Individual fuse short-circuit protection per channel
Compatible Testers BT3561A / BT3562A / BT3563A / BT3564 Battery Testers
Communication Ports LAN, USB, EXT.CONTROL, CONTROL
Cascade Accessory ZC9000 interlink cable for dual rack control
Supporting Software CN040 Multi-channel Scanning Testing Software
Max Input Voltage DC 60V, AC 30V rms
Application Scenarios

Lithium cylindrical/pouch/prismatic cell mass sorting inspection, EV power battery pack multi-cell impedance aging test, energy storage module batch consistency screening, battery factory automatic OCV & internal resistance testing lines.


Product Tags:

HIOKI ZC2003 Switch Mainframe

      

ZC2004 Multiplexer Module

      

528-Channel Lithium Cell Tester

      
Quality HIOKI ZC2003 6-Slot Switch Mainframe Scanning Module Rack for ZC2004 Multiplexer 528-Channel Lithium Cell Batch Testing for sale

HIOKI ZC2003 6-Slot Switch Mainframe Scanning Module Rack for ZC2004 Multiplexer 528-Channel Lithium Cell Batch Testing Images

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